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Vivien Sipkás
Gabriella Bognár



Author(s) and WSEAS

Vivien Sipkás
Gabriella Bognár


WSEAS Transactions on Circuits and Systems


Print ISSN: 1109-2734
E-ISSN: 2224-266X

Volume 17, 2018

Notice: As of 2014 and for the forthcoming years, the publication frequency/periodicity of WSEAS Journals is adapted to the 'continuously updated' model. What this means is that instead of being separated into issues, new papers will be added on a continuous basis, allowing a more regular flow and shorter publication times. The papers will appear in reverse order, therefore the most recent one will be on top.


Volume 16, 2017



Failure Prediction Models for Accelerated Life Tests

AUTHORS: Vivien Sipkás, Gabriella Bognár

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ABSTRACT: The aim of this paper is to introduce the reliability methods in connection with lifetime determination and to design testing method for the prediction of the life of the micro switches. These products are subjected to complex stressing, for example, humidity, temperature, current load and so on. Therefore, the most important failure prediction methods, acceleration life testing methods with one, two or more variables have been introduced, as these methods are essential and necessary for reliability prediction.

KEYWORDS: Accelerated Life Testing, Lifetime, Bathtub Curve, Failure Prediction, Reliability Prediction, Arrhenius Relationship

REFERENCES:

[1] Jung-Geon Ji, Kun-Young Shin, Duk-Gyu Lee, Moon-Shuk Song and Hi Sung Lee, Life Analysis and Reliability Prediction of Micro-Switches based on Life Prediction Method, International Journal of Railway, Vol 5, No. 1/March 2012, pp1-9.

[2] William Q. Meeker Luis A. Escobar, Statistical Methods for Reliability Data, Wiley-Interscience Publication – John Wiley& Sons, INC, Copyright,1998, ISBN 978-0-471-14328-4

[3] Cherry Bhargava, Vijay Kumar Banga, Yaduvir Singh, Failure Prediction and Health Prognostics of Electronic Components: A review, Proceeding of 2014 RAECS UIET Panjab University Chandigarh, 06-08 March, 2014, IEEE 978-1-4799-2291- 8/14/$31.00 - 2013

[4] P. Bardos, Reliability in Electronics Production, Proceeding of PCIM, Munich,1979.

[5] A.L. Hartzell et al., MEMS Reliability, MEMS Reference Shelf, Lifetime Prediction, DOI 10.1007/978-1-4419-6018-4_2, Springer Science + Business Media, LLC 2011, pp 9-42.

[6] European Power Supply Manufacturers Association, Guidelines to Understanding Reliability Prediction Edition 24 June 2005, (www.epsma.org)

[7] Sipkás, Vivien, Bognár, Gabriella, The Application of Accelerated Life Testing Method for Micro Switches, International Journal of Instrumentation and Measurement, ISSN 2534-8841 Vol.3 (2018) pp. 1-5.

[8] Sipkás Vivien, Vadászné Dr. Bognár Gabriella, Mikrokapcsolók gyorsított élettartam vizsgálata, Gépipari Tudományos Egyesület Műszaki Folyóirat 2017/4 LVXXIII. Évfolyam (GÉP), ISSN 0016- 8572, pp.57-60.

[9] Sipkás Vivien, Vadászné Bognár Gabriella, Mikrokapcsolók élettartamának vizsgálata, Jelenkori Társadalmi és Gazdasági Folyamatok 12 (2017), pp. 95-102. (in Hungarian)

[10] Reliability in electronic, Technical article, The expert in power 1-11, www.xppower.com, 2018.10.15

[11] J.A. Jones and J.A. Hayes, A Comparison of Electronic Reliability Prediction Methodologies, IEEE Transactions on reliability, Vol. 48 (1999), pp. 127-134.

[12] W. Nelson, Accelerated Testing: Statistical Models, Test Plans, and Data Analyses. New York: John Wiley & Sons 1990.

WSEAS Transactions on Circuits and Systems, ISSN / E-ISSN: 1109-2734 / 2224-266X, Volume 17, 2018, Art. #21, pp. 173-179


Copyright © 2018 Author(s) retain the copyright of this article. This article is published under the terms of the Creative Commons Attribution License 4.0

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